AXESS ELECTRONICS RX1 Manuel d'utilisateur télécharger pdf (Page 21)

LD-16712C-18

12．Reliability test items

No Test item Conditions

1 High temperature storage test Ta = 60℃ 240h

2 Low temperature storage test Ta = -25℃ 240h

3 High temperature

& high humidity operation test

Ta = 40℃ ; 95%RH 240h

(No condensation)

4 High temperature operation test Tp = 60℃ （panel surface） 240h △3

5 Low temperature operation test Ta = 0℃ 240H

6 Vibration test

(non- operating)

Waveform : Sine wave

Frequency : 10∼57Hz/Vibration width (one side) : 0.075mm

: 58∼500Hz/Gravity : 9.8m/s

Sweep time : 11minutes

Test period : 3 hours

(1 hour for each direction of X,Y,Z)

7 Shock test

(non- operating)

Max. gravity : 490m/s

Pulse width : 11ms, sine wave

Direction : ±X, ±Y, ±Z,

once for each direction.

8 Thermal shock test

(Storage)

Ta=-25℃∼60℃ ; 5 cycles

Test period : 10 hours (1 hour for each temperature)

9 Altitude Ta=50℃,70kPa,3,048m(10,000ft), t=24h (Operating)

Ta=70℃,12kPa,15,240m(50,000ft), t=24h (Storage)

【Result Evaluation Criteria】

Under the display quality test conditions with normal operation state, these shall be no change

which may affect practical display function.

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AXESS ELECTRONICS RX1 Manuel d'utilisateur Page 21